LSI Test Cost

Computer-Aided Test Generation for Four-Phase MOS LSI Circuits

In this paper a practical approach to generate fault detection tests for four-phase MOS LSI circuits is discussed. Emphasis is given to a computer aid on the generation of both primary output and primary input test sequences. A technique to preset the circuit to predictable logic levels is presented.

LRLW-LSI: An Improved Latent Semantic Indexing (LSI) Text Classifier

The task of Text Classification (TC) is to automatically assign natural language texts with thematic categories from a predefined category set. And Latent Semantic Indexing (LSI) is a well known technique in Information Retrieval, especially in dealing with polysemy (one word can have different meanings) and synonymy (different words are used to describe the same concept), but it is not an opti...

Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs

Test Cost Constraint Reduction with Common Cost

Test cost is an important issue in cost-sensitive systems. It is what we pay for obtaining a data item of an object. In some applications, there are some common costs and a cost constraint. The common cost is due to the share of the same resources by several tests. The cost constraint is due to limited money, time, or other resources. Recently, the two issues have been addressed independently i...

Test Today Strategies for Low-cost Test

0740-7475/01/$10.00 © 2001 IEEE November–December 2001 THE 2001 International Technology Roadmap for Semiconductors (ITRS) identifies key manufacturing issues and highlights the cost of test and the associated cost of test equipment. As our analysis of prior roadmap data in Figure 1 (next page) shows, the cost of testing a transistor will equal the cost of fabricating it by around 2012. Traditi...